DB-FIB

Nrog rau kev nce qib sai ntawm cov khoom siv hluav taws xob semiconductor thiab cov thev naus laus zis sib xyaw ua ke, qhov nyuaj ntawm cov cuab yeej thiab cov qauv hauv Circuit Court tau tsa cov kev cai rau microelectronic nti txheej txheem kuaj mob, tsis ua hauj lwm tsom xam, thiab micro / nano fabrication.Dual Beam FIB-SEM system, nrog nws cov haib precision machining thiab microscopic tsom xam muaj peev xwm, tau ua indispensable nyob rau hauv microelectronic tsim thiab manufacturing.

Dual Beam FIB-SEM systemintegrates ob lub Focused Ion Beam (FIB) thiab Scanning Electron Microscope (SEM). Nws ua rau lub sijhawm SEM soj ntsuam ntawm FIB-based micromachining txheej txheem, sib txuas cov kev daws teeb meem siab ntawm cov kab hluav taws xob hluav taws xob nrog cov khoom siv precision ua cov peev txheej ntawm ion beam.