GRGT muab kev tshuaj xyuas lub cev puas tsuaj (DPA) ntawm cov khoom siv uas suav nrog cov khoom siv hluav taws xob, cov khoom siv tsis sib xws thiab kev sib txuas ua ke.
Rau cov txheej txheem semiconductor siab heev, lub peev xwm DPA npog cov chips hauv qab 7nm, cov teeb meem tuaj yeem raug kaw rau hauv cov txheej txheem chip tshwj xeeb lossis ntau yam;rau aerospace-theem huab cua-sealing Cheebtsam nrog dej vapor tswj yuav tsum tau, PPM-theem sab hauv dej vapor muaj pes tsawg leeg tsom xam yuav ua tau los xyuas kom meej cov kev siv tshwj xeeb ntawm cov huab cua-sealing Cheebtsam.
Integrated circuit chips, electronics Cheebtsam, discrete devices, electromechanical devices, cables and connectors, microprocessors, programmable logic devices, memory, AD/DA, bus interfaces, general digital circuits, analog switches, analog devices, microwave Devices, power supply, etc.
● GJB128A-97 Semiconductor discrete device test method
● GJB360A-96 cov khoom siv hluav taws xob thiab cov khoom siv hluav taws xob ntsuas
● GJB548B-2005 Microelectronic device test method thiab txheej txheem
● GJB7243-2011 Kev Ntsuam Xyuas Cov Kev Xav Tau rau Cov Tub Rog Hluav Taws Xob
● GJB40247A-2006 Kev Tshawb Fawb Lub Cev Muaj Zog Rau Cov Tub Rog Hluav Taws Xob
● QJ10003—2008 Kev Ntsuam Xyuas Phau Ntawv Qhia rau Cov Khoom Siv Nthuav Tawm
● MIL-STD-750D semiconductor discrete device test method
● MIL-STD-883G microelectronic ntaus ntawv xeem txoj kev thiab cov txheej txheem
Test hom | Cov khoom kuaj |
Cov khoom tsis muaj kev puas tsuaj | Kev tshuaj xyuas sab nrauv, X-ray tshuaj xyuas, PIND, sealing, davhlau ya nyob twg lub zog, acoustic microscope tshuaj xyuas |
Yam khoom puas tsuaj | Laser de-capsulation, tshuaj e-capsulation, kev tshuaj ntsuam xyuas hauv cov pa roj, kev tshuaj xyuas sab hauv, SEM tshuaj xyuas, kev sib txuas lub zog, shear zog, nplaum lub zog, nti delamination, substrate soj ntsuam, PN hlws ris dyeing, DB FIB, kub qhov chaw nrhiav kom pom, leakage txoj hauj lwm Kev kuaj pom, kuaj pom crater, ESD kuaj |